The SmartProber is SmartTip’s solution for characterization of thin film stacks on a microscopic scale. By using CIPT probes to contact samples, a variety of four point probe measurements can be conducted, including Current-In-Plane Tunneling (CIPT) characterization of a tunnel junction stacks.

Currently, two SmartProber systems are available: the SmartProber-TT is a low cost system especially suited for research and development on in-plane or non-magnetic samples, while the SmartProber-P1 can map 300 mm wafers and boasts a high perpendicular-to-plane magnetic field.

Open source software

To increase versatility, a large part of the SmartProber’s software is open source. This allows the creation of custom measurement routines, changing the user interface and/or data file format to custom standards, or create `smart measurements’ in which the next measurement to perform will change depending on the values measured in previous measurements.