The SmartProber is SmartTip’s solution for characterization of thin film stacks on a microscopic scale. By using CIPT probes to contact samples, a variety of four point probe measurements can be conducted, including Current-In-Plane Tunneling (CIPT) characterization of a tunnel junction stacks. Currently, two SmartProber systems are available: the TT (SmartProber-TT Bruker information page) is a low cost system especially suited for research and development, while the P1 (SmartProber-P1 Bruker information page) can map 300 mm wafers and boasts a high perpendicular-to-plane magnetic field.